Recombination of Charge Carriers in Semiconductors and its Effect on Lifetime

Authors

  • Мuysin Nortoshevich Аlikulov Head of the Department of Physics and Electronics, candidate of physics and mechanical sciences, Karshi engineering-economics institute Karshi city, street “Mustakillik” House 225

Keywords:

silicon, generation, recombination, carrier, trap, lifetime

Abstract

This work has researched the recombination processes that occur in semiconductors and its effect on the lifetime of charge carriers. It has been shown that the rate of recombination under external influence depends on the concentration of non-balanced charge carriers. It has been argued that the recombination rate of interbranch radiation is greater in straight-zone semiconductors than in faulty-zone semiconductors, and that the lifetime of electrons and cavities is much larger in straight-zone semiconductors. The reasons why the lifetime of non-primary charge carriers increases with increasing temperature are explained.

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Published

2023-10-05

How to Cite

Recombination of Charge Carriers in Semiconductors and its Effect on Lifetime. (2023). Information Horizons: American Journal of Library and Information Science Innovation (2993-2777), 1(8), 1-6. https://grnjournal.us.e-scholar.org/index.php/AJLISI/article/view/882